Description
STMicroelectronics is seeking an expert in patterning process effects to characterize and model lithography and etch patterning processes using SEM inspection and OPC software. The role involves developing OPC correction scripts, contributing to technology development, and participating in design/technology co-optimization groups. Candidates should be proficient in a scientific approach, familiar with multi-processor Unix environments, and knowledgeable about lithography and etch patterning processes in microelectronics.
