Description
Micron Technology is hiring a Metrology Application Engineer to develop and implement metrology measurement techniques for semiconductor films, including lithography overlay, CD-SEM, ellipsometry, scatterometry, XRF, and surface profiling. The role supports special work requests, supplier tool CIP, NPI transfers, quality metrics, metrology performance, fab operations, yield improvement, and the standardization of metrology knowledge. The position also emphasizes AI-enabled tools, automation, data-driven insights, and continuous improvement in semiconductor manufacturing.
