Description
QD is hiring an Inline Metrology Discovery Lead to identify and validate wafer-level and high-volume manufacturing use cases for quantum magnetic-field imaging in semiconductor inspection and metrology. The role leads a multidisciplinary team, works with foundries, IDMs, and OSATs, prioritizes opportunities, secures samples and defect context, runs measurement campaigns, and feeds validated findings into the inline product roadmap. It requires 10+ years of semiconductor HVM, process control, inline inspection, or metrology experience; knowledge of tool qualification, sampling, cost of ownership, integration, advanced-packaging and BEOL defect physics; and an industry network across Europe, the United States, and Asia.
