Description
Micron is seeking a Semiconductor Metrology Lead to lead research and development, operations, and sustainment of advanced CDSEM metrology, with additional focus on AFM, overlay/registration, X-ray metrology, and optical techniques. The role develops and qualifies CD metrology methods, drives inline detection, performs CD, profile, and roughness analysis, partners with design and process teams, generates metrology reports, benchmarks tools, and mentors engineers. Candidates should have semiconductor metrology experience, instrumentation and calibration knowledge, semiconductor process understanding, digital and data-analysis skills, and an engineering, physics, or materials-science degree; Micron also offers consideration for applicants with a BS and five years of semiconductor experience.
